IEEE Transactions on Device and Materials Reliability

The scientific journal IEEE Transactions on Device and Materials Reliability is included in the Scopus database. Based on 2020, SJR is 0.416. Publisher country is الولايات المتحدة الأمريكية. The main subject areas of published articles are Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Electronic, Optical and Magnetic Materials.

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Percentile Scopus ASJC Code Scopus Sub-Subject Area Quartile
61 2504 Electronic, Optical and Magnetic Materials 2
70 2213 Safety, Risk, Reliability and Quality 2
65 2208 Electrical and Electronic Engineering 2
CiteScore Source ID
3,3 https://scopus.com/sourceid/26049
Web Site Articles in 2018 Articles in 2019 Articles in 2020
Link 82 105 89

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  • ISSN: 15304388
  • The scientific journal is included in the Scopus database.
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