Electronic Device Failure Analysis

The scientific journal Electronic Device Failure Analysis is included in the Scopus database. Based on 2020, SJR is 0.118. Publisher country is United States of America. The main subject areas of published articles are Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality.

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Percentile Scopus ASJC Code Scopus Sub-Subject Area Quartile
12 2213 Safety, Risk, Reliability and Quality 4
8 2208 Electrical and Electronic Engineering 4
CiteScore Source ID
0.3 https://scopus.com/sourceid/144890
Web Site Articles in 2018 Articles in 2019 Articles in 2020
Link 27 24 18

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  • ISSN: 15370755
  • The scientific journal is included in the Scopus database.
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